This work proposes a 2-dimensional programable SRAM-based PUF. The selection of challenge groups, orders, and sequence lengths dominates the responses with challenge-response pairs (CRPs) by order of rows (sequencelength−1)× columns (sequencelength−1) . The PUF bit cell has split word-lines with vertical and horizontal connections, the bit-lines are placed orthogonally to generate one-bit data with four cells, the entropy source is enriched to 24 transistors. The proposed PUF supports multiple data maps from a single chip. A test chip was fabricated in 65 nm CMOS technology. Under 0.8V and 20 °C (nominal point), the bit error rate reaches 3%. In a single chip, the hamming distance achieves 42.49% within the same group and different orders of challenges, and 47.32% within the different groups of challenges (when the sequence length is 5). The measured inter-hamming distance between chips is improved to 49.47%.
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A 6T SRAM Based Two-Dimensional Configurable Challenge-Response PUF for Portable Devices