This brief presents a second-order noise-shaping (NS) successive approximation register (SAR) analog-to-digital converter (ADC) with two passive integrators. Due to the separation of the preamplifier, these two integrators become independent of each other and the size of the second integrator can be reduced. The NS SAR also realizes the zeros optimization of the noise transfer function (NTF). The analysis shows the NS performance of the proposed ADC is insensitive to the gain variation of the multipath comparator. To mitigate the harmonic distortion caused by capacitor mismatch, thermometer-code 4-bit MSBs are implemented with data weighted averaging (DWA) technique. The overall architecture is simple and robust, which only requires minor modifications to the standard SAR ADC. A prototype 9-bit NS-SAR ADC is designed and simulated in a 130-nm CMOS process. It consumes 59.9 μW of power when operating at 2-MS/s sampling frequency. The proposed ADC achieves peak Schreier figure of merits (FoMs) of 171.9 dB with 78.69-dB signal-to-noise-and-distortion ratio (SNDR) at an oversampling ratio (OSR) of 8.
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A Second-Order Noise-Shaping SAR ADC Using Two Passive Integrators Separated by the Comparator