This paper presents an on-chip stepwise ramp stimulus generator aimed at static linearity test applications for analog-to-digital converters (ADCs). The proposed ramp stimulus generator is based on a simple switched-capacitor integrator with a constant dc input. The integrator has been conveniently modified to produce a very small integration gain proportional to the capacitance difference of two capacitors, in such a way that the resulting stepwise ramp signal at the output has a step size below the least significant bit (LSB) of the target ADC under test. In order to verify the feasibility of the proposed ramp generation technique, this paper details the design and experimental characterization of a proof-of-concept stepwise ramp generator in a 65-nm CMOS technology. Experimental results on 15 fabricated samples show an average linearity of 14.5 effective bits in a differential output range of ±2 V. Moreover, a discrete time static linearity measurement strategy is proposed and, as a proof-of-concept validation, it is verified on an off-the-shelf 11-bit ADC using the fabricated generator samples. Experimental results show an accuracy of ±0.3 LSB in the measurement of the integral nonlinearity of the ADC under test.